SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION BY DIETER K.SCHRODER PDF

SEMICONDUCTOR. MATERIAL AND DEVICE. CHARACTERIZATION. Third Edition. DIETER K. SCHRODER. Arizona State University. Tempe, AZ. A JOHN. Library of Congress Cataloging-in-Publication Data: Schroder, Dieter K. Semiconductor material and device characterization / by Dieter K. Schroder. p. cm. 10 Feb Dieter K. Schroder Semiconductor Material and Device Characterizationremains the sole text dedicated to characterization techniques.

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Semiconductor Material and Device Characterization – Dieter K. Schroder – Google Books

Chapter 2 Carrier and Doping Density. Permissions Request permission to reuse content from this site. Chapter 12 Reliability k.chroder Failure Analysis. High Temperature Electronics F. The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers.

Institute of Electrical and Electronics Engineers. Plus, two k.schroer chapters have been added: Chapter 9 Chargebased and Probe Characterization. Added to Your Shopping Cart.

The Third Edition of the anr lauded Semiconductor Material and Device Characterization bringsthe text fully up-to-date with the latest developments in the fieldand includes new pedagogical tools to assist readers. Schroder No preview available – Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques formeasuring semiconductor materials and devices.

An Instructor’s Manual presenting detailed solutions to all theproblems in the book is available from the Wiley editorialdepartment. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques.

This chapter also examinesprobe-based measurements, including scanning capacitance, scanningKelvin force, scanning spreading resistance, and ballistic electronemission microscopy. Chapter 10 Optical Characterization.

Semiconductor Material and Device Characterization, 3rd Edition

Contents Chapter 1 Resistivity. Would you like to change to the site?

Updated and revised figures and examples reflecting the most current data and information new references offering access to the latest research and discussions in specialized topics New problems and review questions at the end of each chapter to test readers’ understanding of the material In addition, readers will find fully updated and revised sections in each chapter.

Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading cyaracterization graduate students as well as for professionals working in the field of semiconductor devices and materials.

Plus, two new chapters have been added: Coverage includesthe full range of electrical and optical characterization methods,including the more specialized chemical and physical techniques.

Semiconductor Material and Device Characterization

Readers familiar with the previous two editions will discover athoroughly revised and updated Third Editionincluding: Appendix 2 Abbreviations and Acronyms. Description This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in charxcterization field and includes new pedagogical tools to assist readers.

Chapter 3 Contact Resistance and Schottky Barriers. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. An Instructor’s Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

Not only doesthe Third Edition set forth all the latest measurementtechniques, but it also examines new interpretations and newapplications of existing techniques. Schroder Snippet view – Venezuela Section Snippet view – Request permission to reuse content from this site.

Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Editionincluding:. Selected pages Semicomductor 6. My library Help Advanced Book Search.